X-ray Fluorescence (XRF): XRF is a non-destructive analytical technique that uses X-rays to excite atoms in a sample, causing them to emit characteristic X-rays. This method is ideal for analyzing the elemental composition of metals and alloys, providing rapid results with minimal sample preparation.
Inductively Coupled Plasma Mass Spectrometry (ICP-MS): ICP-MS is a highly sensitive technique that ionizes samples in a high-temperature plasma and measures the mass-to-charge ratio of ions. This method is particularly useful for detecting trace elements in high-purity materials, offering unparalleled sensitivity and accuracy.
Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES): ICP-OES measures the emission of light from excited atoms in a plasma, allowing for the simultaneous detection of multiple elements. This technique is widely used for quality control and impurity analysis in various industries due to its speed and accuracy.
Metal Purity Analysis Service


